Fingerprint
Dive into the research topics of 'A fast and high-quality charge model for the next generation general AMBER force field'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
A fast and high-quality charge model for the next generation general AMBER force field
Xibing He, Viet H. Man, Wei Yang, Tai Sung Lee, Junmei Wang
Research output: Contribution to journal › Article › peer-review
180
Scopus
citations