A high contrast 400-2500 nm hyperspectral checkerboard consisting of Acktar material cut with a femto second laser

Janos C. Keresztes, Anne Henrottin, Mohammad Goodarzi, Niels Wouters, Jeroen Van Roy, Wouter Saeys

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Visible-near infrared (Vis-NIR) and short wave infrared (SWIR) hyperspectral imaging (HSI) are gaining interest in the food sorting industry. As for traditional machine vision (MV), spectral image registration is an important step which affects the quality of the sorting system. Unfortunately, it currently still remains challenging to accurately register the images acquired with the different imagers as this requires a reference with good contrast over the full spectral range. Therefore, the objective of this work was to develop an accurate high contrast checkerboard over the full spectral range. From the investigated white and dark materials, Teflon and Acktar were found to present very good contrast over the full spectral range from 400 to 2500 nm, with a minimal contrast ratio of 60% in the Vis-NIR and 98 % in the SWIR. The Metal Velvet self-adhesive coating from Acktar was selected as it also provides low specular reflectance. This was taped onto a near-Lambertian polished Teflon plate and one out of two squares were removed after laser cutting the dark coating with an accuracy below 0.1 mm. As standard technologies such as nano-second pulsed lasers generated unwanted damages on both materials, a pulsed femto-second laser setup from Lasea with 60 μm accuracy was used to manufacture the checkerboard. This pattern was monitored with an Imec Vis-NIR and a Headwall SWIR HSI pushbroom hyperspectral camera. Good contrast was obtained over the full range of both HSI systems and the estimated effective focal length for the Vis-NIR HSI was determined with computer vision to be 0.5 mm, close to the lens model at high contrast.

Original languageEnglish (US)
Title of host publicationOptomechanical Engineering 2015
PublisherSPIE
Volume9573
ISBN (Electronic)9781628417395
DOIs
StatePublished - Jan 1 2015
EventOptomechanical Engineering 2015 - San Diego, United States
Duration: Aug 10 2015Aug 12 2015

Other

OtherOptomechanical Engineering 2015
CountryUnited States
CitySan Diego
Period8/10/158/12/15

Fingerprint

Femtosecond Laser
Hyperspectral Imaging
Infrared imaging
Infrared Imaging
Infrared radiation
Infrared
Lasers
Polytetrafluoroethylene
Polytetrafluoroethylenes
Sorting
Computer vision
Pulsed Laser
lasers
Range of data
teflon (trademark)
computer vision
Coating
classifying
Coatings
Image registration

Keywords

  • Calibration
  • Carbon nanotube
  • Computer vision
  • Femtosecond laser
  • Hyperspectral imaging
  • Instrumentation
  • Laser material processing
  • Metrology
  • Super dark material

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Keresztes, J. C., Henrottin, A., Goodarzi, M., Wouters, N., Van Roy, J., & Saeys, W. (2015). A high contrast 400-2500 nm hyperspectral checkerboard consisting of Acktar material cut with a femto second laser. In Optomechanical Engineering 2015 (Vol. 9573). [95730Q] SPIE. https://doi.org/10.1117/12.2191102

A high contrast 400-2500 nm hyperspectral checkerboard consisting of Acktar material cut with a femto second laser. / Keresztes, Janos C.; Henrottin, Anne; Goodarzi, Mohammad; Wouters, Niels; Van Roy, Jeroen; Saeys, Wouter.

Optomechanical Engineering 2015. Vol. 9573 SPIE, 2015. 95730Q.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Keresztes, JC, Henrottin, A, Goodarzi, M, Wouters, N, Van Roy, J & Saeys, W 2015, A high contrast 400-2500 nm hyperspectral checkerboard consisting of Acktar material cut with a femto second laser. in Optomechanical Engineering 2015. vol. 9573, 95730Q, SPIE, Optomechanical Engineering 2015, San Diego, United States, 8/10/15. https://doi.org/10.1117/12.2191102
Keresztes JC, Henrottin A, Goodarzi M, Wouters N, Van Roy J, Saeys W. A high contrast 400-2500 nm hyperspectral checkerboard consisting of Acktar material cut with a femto second laser. In Optomechanical Engineering 2015. Vol. 9573. SPIE. 2015. 95730Q https://doi.org/10.1117/12.2191102
Keresztes, Janos C. ; Henrottin, Anne ; Goodarzi, Mohammad ; Wouters, Niels ; Van Roy, Jeroen ; Saeys, Wouter. / A high contrast 400-2500 nm hyperspectral checkerboard consisting of Acktar material cut with a femto second laser. Optomechanical Engineering 2015. Vol. 9573 SPIE, 2015.
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abstract = "Visible-near infrared (Vis-NIR) and short wave infrared (SWIR) hyperspectral imaging (HSI) are gaining interest in the food sorting industry. As for traditional machine vision (MV), spectral image registration is an important step which affects the quality of the sorting system. Unfortunately, it currently still remains challenging to accurately register the images acquired with the different imagers as this requires a reference with good contrast over the full spectral range. Therefore, the objective of this work was to develop an accurate high contrast checkerboard over the full spectral range. From the investigated white and dark materials, Teflon and Acktar were found to present very good contrast over the full spectral range from 400 to 2500 nm, with a minimal contrast ratio of 60{\%} in the Vis-NIR and 98 {\%} in the SWIR. The Metal Velvet self-adhesive coating from Acktar was selected as it also provides low specular reflectance. This was taped onto a near-Lambertian polished Teflon plate and one out of two squares were removed after laser cutting the dark coating with an accuracy below 0.1 mm. As standard technologies such as nano-second pulsed lasers generated unwanted damages on both materials, a pulsed femto-second laser setup from Lasea with 60 μm accuracy was used to manufacture the checkerboard. This pattern was monitored with an Imec Vis-NIR and a Headwall SWIR HSI pushbroom hyperspectral camera. Good contrast was obtained over the full range of both HSI systems and the estimated effective focal length for the Vis-NIR HSI was determined with computer vision to be 0.5 mm, close to the lens model at high contrast.",
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