Chemical shift artifact in clinical magnetic resonance images at 0.35 T

J. C. Weinreb, L. Brateman, E. E. Babcock, K. R. Maravilla, J. M. Cohen, S. D. Horner

Research output: Contribution to journalArticle

18 Scopus citations

Abstract

A thin, low-intensity line, which partially surrounds many structures on magnetic resonance imaging (MRI), is an artifact due to the phenomenon of chemical shift and should not be mistaken for a normal or abnormal morphologic structure. This artifact can be recognized by its characteristic appearance perpendicular to the direction of the frequency-encoding gradient at the interface of tissues with different chemical shift properties. Confinement within or extension beyond this thin, low-intensity line cannot be used as a criterion for staging neoplasms. Once recognized, the chemical shift artifact should not impede the use of MRI for clinical imaging at 0.35 T.

Original languageEnglish (US)
Pages (from-to)183-185
Number of pages3
JournalAmerican Journal of Roentgenology
Volume145
Issue number1
DOIs
StatePublished - Jan 1 1985

ASJC Scopus subject areas

  • Radiology Nuclear Medicine and imaging

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    Weinreb, J. C., Brateman, L., Babcock, E. E., Maravilla, K. R., Cohen, J. M., & Horner, S. D. (1985). Chemical shift artifact in clinical magnetic resonance images at 0.35 T. American Journal of Roentgenology, 145(1), 183-185. https://doi.org/10.2214/ajr.145.1.183