Co-occurring defect analysis: A platform for analyzing birth defect co-occurrence in registries

Renata H. Benjamin, Xiao Yu, Maria Luisa Navarro Sanchez, Han Chen, Laura E. Mitchell, Peter H. Langlois, Mark A. Canfield, Michael D. Swartz, Angela E. Scheuerle, Daryl A. Scott, Hope Northrup, Christian P. Schaaf, Joseph W. Ray, Scott D. McLean, Philip J. Lupo, A. J. Agopian