Measurement of coincidence timing resolution with CdTe detectors

Y. Shao, H. B. Barber, S. Balzer, S. R. Cherry

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

The coincidence timing resolution is a critical performance parameter to determine if direct gamma-ray detection by semiconductor detector materials such as CdTe or CdZnTe may be suitable for use in positron emission tomography (PET) systems. We report experimental results of the coincidence timing resolution measured with a pair of 2×2×10 mm3 CdTe detectors irradiated by 511 keV gamma rays under conditions that allow good timing resolution and good energy resolution to be obtained simultaneously. The measured coincidence time resolutions ranged from 14 ns (350 keV lower energy threshold) to 24 ns (100 keV lower energy threshold). We also found that the coincidence timing resolution was proportional to the signal rise time, and that both of these were proportional to the electron transit time.

Original languageEnglish (US)
Pages (from-to)254-264
Number of pages11
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4142
DOIs
StatePublished - Jan 1 2000

Fingerprint

CdTe
Coincidence
Gamma rays
Timing
time measurement
Detector
Detectors
Semiconductor detectors
Positron emission tomography
detectors
Gamma Rays
Electrons
Energy
Directly proportional
gamma rays
CdZnTe
Positron Emission Tomography
time signals
thresholds
transit time

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Measurement of coincidence timing resolution with CdTe detectors. / Shao, Y.; Barber, H. B.; Balzer, S.; Cherry, S. R.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 4142, 01.01.2000, p. 254-264.

Research output: Contribution to journalArticle

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