Pulsed Laser Imaging Demonstrates the Mechanism of Current Rectification at a Hydrogel Interface

Piotr E. Marszalek, Vladislav S. Markin, Toyoichi Tanaka, Haruma Kawaguchi, Julio M. Fernandez

Research output: Contribution to journalArticle

3 Scopus citations

Abstract

The accumulation or depletion of charge carriers at a p-n junction results in electronic rectification.1 Similarly, we show that accumulation or depletion of ions underlies ionic rectification at a single hydroge.-electrolyte interface. We monitored the rapid formation and collapse of ionic gradients at the hydrogel-electrolyte interface of natural23 and synthetic4 charged microparticles by the use of pulsed-laser microscopy.5,6 We conclude that the flow of the current is determined by the charge of the hydrogel and the geometry of the electric field applied to it. Our findings can be utilized to design hydrogel-based microswitches and “wet” integrated circuits.

Original languageEnglish (US)
Pages (from-to)4196-4198
Number of pages3
JournalLangmuir
Volume11
Issue number11
DOIs
StatePublished - Nov 1 1995

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Spectroscopy
  • Electrochemistry

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    Marszalek, P. E., Markin, V. S., Tanaka, T., Kawaguchi, H., & Fernandez, J. M. (1995). Pulsed Laser Imaging Demonstrates the Mechanism of Current Rectification at a Hydrogel Interface. Langmuir, 11(11), 4196-4198. https://doi.org/10.1021/la00011a004