Rheological microscopy: local mechanical properties from microrheology

D. T. Chen, E. R. Weeks, J. C. Crocker, M. F. Islam, R. Verma, J. Gruber, A. J. Levine, T. C. Lubensky, A. G. Yodh

Research output: Contribution to journalArticlepeer-review

167 Scopus citations

Abstract

We demonstrate how tracer microrheology methods can be extended to study submicron scale variations in the viscoelastic response of soft materials; in particular, a semidilute solution of lambda-DNA. The polymer concentration is depleted near the surfaces of the tracer particles, within a distance comparable to the polymer correlation length. The rheology of this microscopic layer alters the tracers' motion and can be precisely quantified using one- and two-point microrheology. Interestingly, we found this mechanically distinct layer to be twice as thick as the layer of depleted concentration, likely due to solvent drainage through the locally perturbed polymer structure.

Original languageEnglish (US)
Pages (from-to)108301
Number of pages1
JournalPhysical Review Letters
Volume90
Issue number10
StatePublished - Mar 14 2003
Externally publishedYes

ASJC Scopus subject areas

  • General Physics and Astronomy

Fingerprint

Dive into the research topics of 'Rheological microscopy: local mechanical properties from microrheology'. Together they form a unique fingerprint.

Cite this