Tradeoffs in helical CT

the effects of collimation and pitch on dose, noise, and slice sensitivity profiles

Michael F. McNitt-Gray, Chris Cagnon, Tim Solberg

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

To investigate the tradeoffs that occur in helical CT scanning due to the different combinations of pitch and collimation available. These tradeoffs affect patient dose, image noise and slice sensitivity profiles. For both a single and dual detector helical CT scanners, different combinations of pitch and collimation were investigated. For each combination, patient dose was estimated using calculations from TLD measurements made with a standard CTDI phantom. Noise was measured using a homogeneous water phantom. Slice sensitivity profiles were measured using phantoms approximating impulse functions. For each scanner, the effects on noise, slice thickness and radiation dose of variations in pitch and collimation were reported. In addition, the tradeoffs between combinations of pitch and collimation that utilize the same table speed were examined. As an example, the single helical scanner can obtain a table speed of 10 mm/s using either: (1) a collimation of 10 mm and a pitch of 1, or by (2) collimating to 5 mm and using a pitch of 2. Assuming a constant mA, the radiation dose decreases from 1.2 rad at the center to .71 rad at the center, when going from the first to the second technique. The image noise increases from a standard deviation of 4.1 to 5.7; and the slice sensitivity profile decreases from 10.46 mm to 6.55 mm. Results for other pitch and collimation combinations are reported as well as the results for the dual helical scanner. For a fixed table movement speed, thinner slices with higher pitches give better z-axis resolution and lower patient dose while increasing image noise.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsRichard L. Van Metter, Jacob Beutel
Pages427-437
Number of pages11
Volume2708
StatePublished - 1996
EventMedical Imaging 1996: Physics of Medical Imaging - Newport Beach, CA, USA
Duration: Feb 11 1996Feb 13 1996

Other

OtherMedical Imaging 1996: Physics of Medical Imaging
CityNewport Beach, CA, USA
Period2/11/962/13/96

Fingerprint

collimation
tradeoffs
dosage
scanners
Dosimetry
sensitivity
profiles
Detectors
Scanning
radiation
impulses
Water
standard deviation
scanning
detectors
water

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

McNitt-Gray, M. F., Cagnon, C., & Solberg, T. (1996). Tradeoffs in helical CT: the effects of collimation and pitch on dose, noise, and slice sensitivity profiles. In R. L. Van Metter, & J. Beutel (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 2708, pp. 427-437)

Tradeoffs in helical CT : the effects of collimation and pitch on dose, noise, and slice sensitivity profiles. / McNitt-Gray, Michael F.; Cagnon, Chris; Solberg, Tim.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / Richard L. Van Metter; Jacob Beutel. Vol. 2708 1996. p. 427-437.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

McNitt-Gray, MF, Cagnon, C & Solberg, T 1996, Tradeoffs in helical CT: the effects of collimation and pitch on dose, noise, and slice sensitivity profiles. in RL Van Metter & J Beutel (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 2708, pp. 427-437, Medical Imaging 1996: Physics of Medical Imaging, Newport Beach, CA, USA, 2/11/96.
McNitt-Gray MF, Cagnon C, Solberg T. Tradeoffs in helical CT: the effects of collimation and pitch on dose, noise, and slice sensitivity profiles. In Van Metter RL, Beutel J, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 2708. 1996. p. 427-437
McNitt-Gray, Michael F. ; Cagnon, Chris ; Solberg, Tim. / Tradeoffs in helical CT : the effects of collimation and pitch on dose, noise, and slice sensitivity profiles. Proceedings of SPIE - The International Society for Optical Engineering. editor / Richard L. Van Metter ; Jacob Beutel. Vol. 2708 1996. pp. 427-437
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