Unsupervised border detection of skin lesion images

M. Emre Celebi, Y. Alp Aslandogan, Paul R. Bergstresser

Research output: Chapter in Book/Report/Conference proceedingConference contribution

40 Scopus citations

Abstract

As a result of the advances in skin imaging technology and the development of suitable image processing/computer vision algorithms, during the last decade, there has been a significant increase of interest in the computer-aided diagnosis of skin cancer. Automated border extraction is one of the most important steps in this procedure since the accuracy of the subsequent steps crucially depends on the accuracy of this very first step. In this paper, we present an unsupervised approach to border detection in skin lesion (tumor) images based on a modified version of the JSEG algorithm. The segmentation results are visually examined by an expert dermatologist and are found to be highly accurate.

Original languageEnglish (US)
Title of host publicationProceedings ITCC 2005 - International Conference on Information Technology
Subtitle of host publicationCoding and Computing
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages123-128
Number of pages6
ISBN (Print)0769523153, 9780769523156
DOIs
StatePublished - 2005
EventITCC 2005 - International Conference on Information Technology: Coding and Computing - Las Vegas, NV, United States
Duration: Apr 4 2005Apr 6 2005

Publication series

NameInternational Conference on Information Technology: Coding and Computing, ITCC
Volume2

Other

OtherITCC 2005 - International Conference on Information Technology: Coding and Computing
CountryUnited States
CityLas Vegas, NV
Period4/4/054/6/05

ASJC Scopus subject areas

  • Engineering(all)

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    Celebi, M. E., Aslandogan, Y. A., & Bergstresser, P. R. (2005). Unsupervised border detection of skin lesion images. In Proceedings ITCC 2005 - International Conference on Information Technology: Coding and Computing (pp. 123-128). (International Conference on Information Technology: Coding and Computing, ITCC; Vol. 2). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/itcc.2005.283