Abstract
Copper concentration gradient in commercial SSR-ZnS:Cu, Al particles was calculated. Phosphor particles were etched by hydrochloric acid. The average copper concentration was measured by inductively coupled plasma spectroscopy (ICP). The surface copper concentration was estimated by the x-ray photoelectron spectroscopy (XPS). The concentration effect of copper on the luminescent intensity was specified by a coefficient.
Original language | English (US) |
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Pages (from-to) | 4945-4947 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 83 |
Issue number | 24 |
DOIs | |
State | Published - Dec 15 2003 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)