TY - GEN
T1 - Lithographically defined si nanowire field effect transistors for biochemical sensing
AU - Hu, Walter
AU - Yoon, Fern
AU - Regonda, Suresh
AU - Fernandes, Poornika
AU - Vogel, Eric M.
AU - Buyukserin, Fatih
AU - Zhao, Xiao Mei
AU - Gao, Jinming
PY - 2008/11/10
Y1 - 2008/11/10
N2 - A process integration of e-beam lithography, plasma etching, and Si processing have been developed to pattern Si nanowires on crystalline Si on insulator wafers. Si nanowires of 12-50 nm linewidth, 30-70 nm height, and 10 μm length have been made. Using these Si nanowires as conducting channels, field effect transistors using the back Si substrate as gate have been fabricated. Good I-V characteristics have been obtained. With the back-gate configuration, the surface of Si nanowires can be functionalized for biochemical sensing applications.
AB - A process integration of e-beam lithography, plasma etching, and Si processing have been developed to pattern Si nanowires on crystalline Si on insulator wafers. Si nanowires of 12-50 nm linewidth, 30-70 nm height, and 10 μm length have been made. Using these Si nanowires as conducting channels, field effect transistors using the back Si substrate as gate have been fabricated. Good I-V characteristics have been obtained. With the back-gate configuration, the surface of Si nanowires can be functionalized for biochemical sensing applications.
UR - http://www.scopus.com/inward/record.url?scp=55349124594&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=55349124594&partnerID=8YFLogxK
U2 - 10.1109/NANO.2008.152
DO - 10.1109/NANO.2008.152
M3 - Conference contribution
AN - SCOPUS:55349124594
SN - 9781424421046
T3 - 2008 8th IEEE Conference on Nanotechnology, IEEE-NANO
SP - 507
EP - 508
BT - 2008 8th IEEE Conference on Nanotechnology, IEEE-NANO
T2 - 2008 8th IEEE Conference on Nanotechnology, IEEE-NANO
Y2 - 18 August 2008 through 21 August 2008
ER -