Noninvasive Estimation of Electrical Properties from Magnetic Resonance Measurements via Global Maxwell Tomography and Match Regularization

Jose E.C. Serrallés, Ilias I. Giannakopoulos, Bei Zhang, Carlotta Ianniello, Martijn A. Cloos, Athanasios G. Polimeridis, Jacob K. White, Daniel K. Sodickson, Luca Daniel, Riccardo Lattanzi

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Engineering & Materials Science