Rheological Microscopy: Local Mechanical Properties from Microrheology

D. T. Chen, E. R. Weeks, J. C. Crocker, M. F. Islam, R. Verma, J. Gruber, A. J. Levine, T. C. Lubensky, A. G. Yodh

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

We demonstrate how tracer microrheology methods can be extended to study submicron scale variations in the viscoelastic response of soft materials; in particular, a semidilute solution of [Formula presented]-DNA. The polymer concentration is depleted near the surfaces of the tracer particles, within a distance comparable to the polymer correlation length. The rheology of this microscopic layer alters the tracers’ motion and can be precisely quantified using one- and two-point microrheology. Interestingly, we found this mechanically distinct layer to be twice as thick as the layer of depleted concentration, likely due to solvent drainage through the locally perturbed polymer structure.

Original languageEnglish (US)
Pages (from-to)4
Number of pages1
JournalPhysical Review Letters
Volume90
Issue number10
DOIs
StatePublished - 2003
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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